Delivering 3D form and flatness measurements, the CCI UHS is capable of recording surface roughness of less than 0.1 nm. The profiler made its debut public appearance at Control 2015 in Stuttgart, in May.
CCI UHS surface profiler released by Taylor Hobson
The latest non-contact surface profiler in the CCI series from Taylor Hobson is the CCI UHS, designed for high speed, large area, non-contact measurement.
