Next generation optical profilers from Taylor Hobson
Taylor Hobson launches CCI SunStar, the next generation of combined thin film and dimensional optical profilers.
The optical profiler merges non-contact dimensional measurement capability with thin and thick film technology.
Able to measure film thickness from 5 um down to 300 nm or less, the CCI SunStar is able to meet the demanding application challenges, including 1st and 2nd generation Solar P-V, High power LED, Displays and Vacuum Coatings.
More detailed information is available in the products section.
