"Advanced machine tool metrology allows the performance of machines to be assessed and underpins the production of more accurate components. As the trend towards nanometric surface finishes and features advances, matching form and finish consistently when producing complex parts remains a major challenge," comments Neil Prescott, managing director of Heidenhain (GB).
"LAMDAMAP is a prime source of relevant knowledge. It allows the next generation of manufacturers to use all available advances in measurement techniques to meet tomorrow's production challenges. That is why Heidenhain is keen to support the conferences and scholarships."
Half of the scholarships went to researchers at the University of Huddersfield, UK: Akshay Potdar, Ali Mohamed Abdulshahed and Moschos Papananias. The remainder were awarded to Jonathan Abir, Cranfield University UK; Fabien Viprey, Laboratoire National de Métrologie et d'Essais, France; and Wiktor Harmatys, Cracow University of Technology, Poland.
This year's conference was organised and hosted by the European Society for Precision Engineering & Nanotechnology (EUSPEN) at the University of Huddersfield.
