Using ABIS II, a wide range of defect types can be detected, including dents, bumps, sink marks, waviness, constrictions and cracks. With the optional integration of a contrast sensor, the detection of contrast-sensitive defects such as adhesive residues, scratches and dirt, is also possible.
ABIS systems can be used with various upgrades and in different ambient conditions, says Zeiss. Their areas of application include routine off-line auditing at regular intervals and the fully automated in-line inspection of parts at the end of a press line.
