Sick OL1 delivers precise detection in micrometre range

The Sick OL1 optical micrometer is a miniature yet rugged addition to the company’s portfolio of displacement technologies for thread, material thickness and edge measurements in continuous, sheet feeding and winding machines. With a miniature sender and receiver placed up to 300 mm apart, the OL1 uses light curtain measurement technology, based on a multi-pixel, linear CMOS sensor, for high-precision, high-repeatability measurement and process control in the micrometre range. The OL1 is teamed with the Sick AOD1 mini displacement evaluation unit for improved stability and output consistency.

With a 10 mm light band and detection resolution down to 0.2 mm, the OL1 is said to be a versatile and stable performer at short ranges, small tolerances and for handling thin materials. According to Sick, the optical micrometer can support precision applications in paper, printing and packaging machines, as well as wire and metal-forming machines.

The Sick OL1 is a sender and receiver in twin miniature (61 x 21 x 10 mm) yet rugged metal housings. A Class 1 laser parallel light curtain is emitted, which is captured by the receiver on a high-resolution CMOS chip, with any object in between registering as a precisely measured shadow.

Alignment is said to be simple using the integrated LED alignment aid at the sensor head. Furthermore, commissioning and integration with machine controls is quick and easy, via the display configuration with individual configuration and calculation through the AOD1 evaluation unit. The AOD1 displacement evaluation unit functionality enables simple interfacing with machine and SCADA factory control systems.