Renishaw to unveil novelties at Control 2009

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Renishaw will be announcing a series of major new initiatives at <a href= "http://www.control-messe.com/en/control" target= "new">Control 2009</a>, 5 to 8 May in Stuttgart, Germany.

The company will be underlining its first CMM retrofit service, its first metrology software, a new surface finish probe and a range of new optical encoders including a fine-pitch absolute encoder with groundbreaking specifications. Visitors will hear how a cost-effective Renishaw CMM retrofit does not require a large investment in new equipment, and is available for all budgets and applications, from touch-trigger probing and 3-axis scanning, through to the latest ultra-fast REVO 5-axis measurement system. Renishaw's new MODUS metrology software and UCC2 controller are part of the offering. Also demonstrated will be the new REVO surface finish probe offering fully integrated surface finish measurement within a CMM program. Control is also an opportunity to see RESOLUTE Renishaw's true absolute, fine-pitch optical encoder system that has excellent dirt immunity, and an impressive specification that breaks new ground in position feedback. The world's first absolute encoder capable of 27-bit resolution at 36,000 rpm, this gives RESOLUTE an astonishing market-leading resolution of just 1 nanometre at 100 m/s for both linear and angle encoder applications. Also on show at Control, TONiC is Renishaw's new super-compact non-contact optical encoder, offering speeds up to 10 m/s and resolutions down to 5 nm for both linear and rotary applications.