Blum-Novotest Z-Nano is updated; better

Blum-Novotest's latest Z-Nano probe system is a development of the existing system that already exists under the same name.

The new and compact tool measuring system can be used on CNC machining centres for automatic tool length measurement and breakage detection duties. It can also undertake temperature compensation in one machine axis.

One of the technological advances is an exchangeable measuring surface that allows a potentially worn or damaged surface to be replaced. Another improvement is the additional spherical disk in the base. This enables easy adjustment and set-up on the machine table, which is ideal for manufacturers loading large billets that could potentially fill the machine bed.

Also, instead of the previous sliding guide system, the new Z-Nano works with a ball guideway. This further reduces the measuring force. The advantage is that now even smaller tools, starting from 0.1 mm diameter, can be measured, depending on tool geometry and material.

Additionally, in its standard version, the probe offers high repeatability of 0.5 µm 2s. For special applications, it is also available with a 'High Precision' design, with a guaranteed repeatability of 0.2 µm 2s.

Author
Andrew Allcock

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