Microscopic inspection

Bowers Metrology's CV MM-650 is suitable for observing the microscopic surfaces of a wide range of non-transparent objects.

It is equipped with a large mechanical stage containing precision guideways and is capable of accommodating large workpieces, with ergonomics ensuring operators are able to achieve rapid, precise control over stage movement, using one hand only.

Ideal for use in metallographic, mineralogy, precision engineering, and electronics laboratories, the CV MM-650's trinocular system can easily be switched from manual observation to the unit's video channel. Other applications include scientific research, teaching, demonstrations within education establishments, or shopfloor use.

The CV MM-650's vertical illumination and trinocular polariser device provides clear, crisp and high-contrast images with or without colour filters. Other features include: plan achromatic objectives with long working distance and wide-field eyepieces; optional quick or slow displacements of the mechanical stage, and a coarse/fine coaxial focus system.

A comprehensive range of optional accessories is available, including a high quality video camera system, with Windows PC based software for image analysis, a photographic unit 10X Viewing eyepiece, a 2.5X/4X Change over photograph attachment and a choice of digital camera C-mount adapters.

Author
Nicki McKenna

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Bowers Metrology Ltd
Bowers Metrology Ltd

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