03 February 2010
Next generation optical profilers from Taylor Hobson
Taylor Hobson launches CCI SunStar, the next generation of combined thin film and dimensional optical profilers.
The optical profiler merges non-contact dimensional measurement capability with thin and thick film technology.
Able to measure film thickness from 5 um down to 300 nm or less, the CCI SunStar is able to meet the demanding application challenges, including 1st and 2nd generation Solar P-V, High power LED, Displays and Vacuum Coatings.
More detailed information is available in the products section.
Author
Michael Richards
This material is protected by Findlay Media copyright
See Terms and Conditions.
One-off usage is permitted but bulk copying is not.
For multiple copies contact the
sales team.
Supporting Information
Related Companies
Taylor Hobson Ltd